Experimental measurements and 3D simulation of the parasitic lateral bipolar transistor triggering within a single finger gg-nMOS under ESD

P. Galy, V. Berland, A. Guilhaume, F. Blanc, J. P. Chante. Experimental measurements and 3D simulation of the parasitic lateral bipolar transistor triggering within a single finger gg-nMOS under ESD. Microelectronics Reliability, 44(9-11):1775-1780, 2004. [doi]

Abstract

Abstract is missing.