HUOPM: High-Utility Occupancy Pattern Mining

Wensheng Gan, Jerry Chun-Wei Lin, Philippe Fournier-Viger, Han-Chieh Chao, Philip S. Yu. HUOPM: High-Utility Occupancy Pattern Mining. IEEE T. Cybernetics, 50(3):1195-1208, 2020. [doi]

Authors

Wensheng Gan

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Jerry Chun-Wei Lin

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Philippe Fournier-Viger

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Han-Chieh Chao

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Philip S. Yu

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