HUOPM: High-Utility Occupancy Pattern Mining

Wensheng Gan, Jerry Chun-Wei Lin, Philippe Fournier-Viger, Han-Chieh Chao, Philip S. Yu. HUOPM: High-Utility Occupancy Pattern Mining. IEEE T. Cybernetics, 50(3):1195-1208, 2020. [doi]

Abstract

Abstract is missing.