Yi Gao, Xing Hu 0008, Tongtong Xu, Xin Xia 0001, David Lo 0001, Xiaohu Yang 0001. MUT: Human-in-the-Loop Unit Test Migration. In Proceedings of the 46th IEEE/ACM International Conference on Software Engineering, ICSE 2024, Lisbon, Portugal, April 14-20, 2024. ACM, 2024. [doi]
Abstract is missing.