Shuai Gao, Chang Cai, Bingxu Ning, Ze He, Jie Liu. Characterization and Classification of Heavy Ion Induced Failures in FPGA-based Logical Circuits. In Fan Ye, Ting-Ao Tang, editors, 14th IEEE International Conference on ASIC, ASICON 2021, Kunming, China, October 26-29, 2021. pages 1-4, IEEE, 2021. [doi]
Abstract is missing.