Turning Clusters into Patterns: Rectangle-Based Discriminative Data Description

Byron J. Gao, Martin Ester. Turning Clusters into Patterns: Rectangle-Based Discriminative Data Description. In Proceedings of the 6th IEEE International Conference on Data Mining (ICDM 2006), 18-22 December 2006, Hong Kong, China. pages 200-211, IEEE Computer Society, 2006. [doi]

Abstract

Abstract is missing.