Xinyu Gao, Yang Feng, Yining Yin, Zixi Liu, Zhenyu Chen 0001, Baowen Xu. Adaptive Test Selection for Deep Neural Networks. In 44th IEEE/ACM 44th International Conference on Software Engineering, ICSE 2022, Pittsburgh, PA, USA, May 25-27, 2022. pages 73-85, IEEE, 2022. [doi]
Abstract is missing.