Ming Gao, Peter Lisherness, Kwang-Ting (Tim) Cheng. Adaptive test selection for post-silicon timing validation: A data mining approach. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-7, IEEE Computer Society, 2012. [doi]
@inproceedings{GaoLC12, title = {Adaptive test selection for post-silicon timing validation: A data mining approach}, author = {Ming Gao and Peter Lisherness and Kwang-Ting (Tim) Cheng}, year = {2012}, doi = {10.1109/TEST.2012.6401540}, url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2012.6401540}, researchr = {https://researchr.org/publication/GaoLC12}, cites = {0}, citedby = {0}, pages = {1-7}, booktitle = {2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012}, publisher = {IEEE Computer Society}, isbn = {978-1-4673-1594-4}, }