An Approach to GUI Test Scenario Generation Using Machine Learning

Jerry Gao, Shiting Li, Chuanqi Tao, Yejun He, Amrutha Pavani Anumalasetty, Erica Wilson Joseph, Akshata Hatwar Kumbashi Sripathi, Himabindu Nayani. An Approach to GUI Test Scenario Generation Using Machine Learning. In IEEE International Conference On Artificial Intelligence Testing, AITest 2022, Newark, CA, USA, August 15-18, 2022. pages 79-86, IEEE, 2022. [doi]

Abstract

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