Unsupervised Sparse Pattern Diagnostic of Defects With Inductive Thermography Imaging System

Bin Gao, Wai Lok Woo, Yunze He, Guiyun Tian. Unsupervised Sparse Pattern Diagnostic of Defects With Inductive Thermography Imaging System. IEEE Trans. Industrial Informatics, 12(1):371-383, 2016. [doi]

Authors

Bin Gao

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Wai Lok Woo

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Yunze He

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Guiyun Tian

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