Bin Gao, Wai Lok Woo, Yunze He, Guiyun Tian. Unsupervised Sparse Pattern Diagnostic of Defects With Inductive Thermography Imaging System. IEEE Trans. Industrial Informatics, 12(1):371-383, 2016. [doi]
@article{GaoWHT16,
title = {Unsupervised Sparse Pattern Diagnostic of Defects With Inductive Thermography Imaging System},
author = {Bin Gao and Wai Lok Woo and Yunze He and Guiyun Tian},
year = {2016},
doi = {10.1109/TII.2015.2492925},
url = {http://dx.doi.org/10.1109/TII.2015.2492925},
researchr = {https://researchr.org/publication/GaoWHT16},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Industrial Informatics},
volume = {12},
number = {1},
pages = {371-383},
}