Correlated Bayesian Model Fusion: Efficient High-Dimensional Performance Modeling of Analog/RF Integrated Circuits Over Multiple Corners

Zhengqi Gao, Fa Wang, Jun Tao 0001, Yangfeng Su, Xuan Zeng 0001, Xin Li 0001. Correlated Bayesian Model Fusion: Efficient High-Dimensional Performance Modeling of Analog/RF Integrated Circuits Over Multiple Corners. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(2):360-370, February 2023. [doi]

@article{GaoWTSZL23,
  title = {Correlated Bayesian Model Fusion: Efficient High-Dimensional Performance Modeling of Analog/RF Integrated Circuits Over Multiple Corners},
  author = {Zhengqi Gao and Fa Wang and Jun Tao 0001 and Yangfeng Su and Xuan Zeng 0001 and Xin Li 0001},
  year = {2023},
  month = {February},
  doi = {10.1109/TCAD.2022.3174170},
  url = {https://doi.org/10.1109/TCAD.2022.3174170},
  researchr = {https://researchr.org/publication/GaoWTSZL23},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {42},
  number = {2},
  pages = {360-370},
}