A Dual-input Fault Diagnosis Model Based on Convolutional Neural Networks and Gated Recurrent Unit Networks for Analog Circuits - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Tianyu Gao, Jingli Yang, Shouda Jiang, Cheng Yang. A Dual-input Fault Diagnosis Model Based on Convolutional Neural Networks and Gated Recurrent Unit Networks for Analog Circuits. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2021, Glasgow, United Kingdom, May 17-20, 2021. pages 1-6, IEEE, 2021. [doi]

This author has not been identified. Look up 'Tianyu Gao' in GoogleThis author has not been identified. Look up 'Jingli Yang' in GoogleThis author has not been identified. Look up 'Shouda Jiang' in GoogleThis author has not been identified. Look up 'Cheng Yang' in Google

runs on WebDSL