A Dual-input Fault Diagnosis Model Based on Convolutional Neural Networks and Gated Recurrent Unit Networks for Analog Circuits - researchr publication references

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Tianyu Gao, Jingli Yang, Shouda Jiang, Cheng Yang. A Dual-input Fault Diagnosis Model Based on Convolutional Neural Networks and Gated Recurrent Unit Networks for Analog Circuits. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2021, Glasgow, United Kingdom, May 17-20, 2021. pages 1-6, IEEE, 2021. [doi]

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