Mingzhi Gao, Zuochang Ye, Yao Peng, Yan Wang, Zhiping Yu. A comprehensive model for gate delay under process variation and different driving and loading conditions. In 11th International Symposium on Quality of Electronic Design (ISQED 2010), 22-24 March 2010, San Jose, CA, USA. pages 406-412, IEEE, 2010. [doi]
@inproceedings{GaoYPWY10,
title = {A comprehensive model for gate delay under process variation and different driving and loading conditions},
author = {Mingzhi Gao and Zuochang Ye and Yao Peng and Yan Wang and Zhiping Yu},
year = {2010},
doi = {10.1109/ISQED.2010.5450543},
url = {http://dx.doi.org/10.1109/ISQED.2010.5450543},
tags = {process modeling},
researchr = {https://researchr.org/publication/GaoYPWY10},
cites = {0},
citedby = {0},
pages = {406-412},
booktitle = {11th International Symposium on Quality of Electronic Design (ISQED 2010), 22-24 March 2010, San Jose, CA, USA},
publisher = {IEEE},
isbn = {978-1-4244-6455-5},
}