Efficient Full-Chip Statistical Leakage Analysis Based on Fast Matrix Vector Product

Mingzhi Gao, Zuochang Ye, Yan Wang, Zhiping Yu. Efficient Full-Chip Statistical Leakage Analysis Based on Fast Matrix Vector Product. IEEE Trans. on CAD of Integrated Circuits and Systems, 31(3):356-369, 2012. [doi]

@article{GaoYWY12,
  title = {Efficient Full-Chip Statistical Leakage Analysis Based on Fast Matrix Vector Product},
  author = {Mingzhi Gao and Zuochang Ye and Yan Wang and Zhiping Yu},
  year = {2012},
  doi = {10.1109/TCAD.2011.2171962},
  url = {http://dx.doi.org/10.1109/TCAD.2011.2171962},
  researchr = {https://researchr.org/publication/GaoYWY12},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {31},
  number = {3},
  pages = {356-369},
}