Back to the Source: Diffusion-Driven Adaptation to Test-Time Corruption

Jin Gao, Jialing Zhang, Xihui Liu, Trevor Darrell, Evan Shelhamer, Dequan Wang. Back to the Source: Diffusion-Driven Adaptation to Test-Time Corruption. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023, Vancouver, BC, Canada, June 17-24, 2023. pages 11786-11796, IEEE, 2023. [doi]

Abstract

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