Yichao Gao, Zhenyu Zhang, Long Zhang, Cheng Gong, Zheng Zheng. A Theoretical Study: The Impact of Cloning Failed Test Cases on the Effectiveness of Fault Localization. In 2013 13th International Conference on Quality Software, Najing, China, July 29-30, 2013. pages 288-291, IEEE, 2013. [doi]
Abstract is missing.