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Comparing Quality Measures for Contrast Pattern Classifiers

Milton García-Borroto, Octavio Loyola-González, José Francisco Martínez Trinidad, Jesús Ariel Carrasco-Ochoa. Comparing Quality Measures for Contrast Pattern Classifiers. In José Ruiz-Shulcloper, Gabriella Sanniti di Baja, editors, Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 18th Iberoamerican Congress, CIARP 2013, Havana, Cuba, November 20-23, 2013, Proceedings, Part I. Volume 8258 of Lecture Notes in Computer Science, pages 311-318, Springer, 2013. [doi]

Authors

Milton García-Borroto

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Octavio Loyola-González

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José Francisco Martínez Trinidad

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Jesús Ariel Carrasco-Ochoa

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