Comparing Quality Measures for Contrast Pattern Classifiers

Milton García-Borroto, Octavio Loyola-González, José Francisco Martínez Trinidad, Jesús Ariel Carrasco-Ochoa. Comparing Quality Measures for Contrast Pattern Classifiers. In José Ruiz-Shulcloper, Gabriella Sanniti di Baja, editors, Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 18th Iberoamerican Congress, CIARP 2013, Havana, Cuba, November 20-23, 2013, Proceedings, Part I. Volume 8258 of Lecture Notes in Computer Science, pages 311-318, Springer, 2013. [doi]

@inproceedings{Garcia-BorrotoLTC13,
  title = {Comparing Quality Measures for Contrast Pattern Classifiers},
  author = {Milton García-Borroto and Octavio Loyola-González and José Francisco Martínez Trinidad and Jesús Ariel Carrasco-Ochoa},
  year = {2013},
  doi = {10.1007/978-3-642-41822-8_39},
  url = {http://dx.doi.org/10.1007/978-3-642-41822-8_39},
  researchr = {https://researchr.org/publication/Garcia-BorrotoLTC13},
  cites = {0},
  citedby = {0},
  pages = {311-318},
  booktitle = {Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 18th Iberoamerican Congress, CIARP 2013, Havana, Cuba, November 20-23, 2013, Proceedings, Part I},
  editor = {José Ruiz-Shulcloper and Gabriella Sanniti di Baja},
  volume = {8258},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {978-3-642-41821-1},
}