Computing the detection of Small Delay Defects caused by resistive opens of nanometer ICs - researchr publication authors

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Jose Luis Garcia-Gervacio, Víctor H. Champac. Computing the detection of Small Delay Defects caused by resistive opens of nanometer ICs. In 15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic. pages 126-131, IEEE Computer Society, 2010. [doi]

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