Jose Luis Garcia-Gervacio, Víctor H. Champac. Computing the detection of Small Delay Defects caused by resistive opens of nanometer ICs. In 15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic. pages 126-131, IEEE Computer Society, 2010. [doi]
@inproceedings{Garcia-GervacioC10,
title = {Computing the detection of Small Delay Defects caused by resistive opens of nanometer ICs},
author = {Jose Luis Garcia-Gervacio and Víctor H. Champac},
year = {2010},
doi = {10.1109/ETSYM.2010.5512771},
url = {http://dx.doi.org/10.1109/ETSYM.2010.5512771},
tags = {source-to-source, open-source},
researchr = {https://researchr.org/publication/Garcia-GervacioC10},
cites = {0},
citedby = {0},
pages = {126-131},
booktitle = {15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-5833-2},
}