Jose Luis Garcia-Gervacio, Víctor H. Champac. Computing the Detection Probability for Small Delay Defects of Nanometer ICs. J. Electronic Testing, 27(6):741-752, 2011. [doi]
@article{Garcia-GervacioC11,
title = {Computing the Detection Probability for Small Delay Defects of Nanometer ICs},
author = {Jose Luis Garcia-Gervacio and Víctor H. Champac},
year = {2011},
doi = {10.1007/s10836-011-5256-1},
url = {http://dx.doi.org/10.1007/s10836-011-5256-1},
researchr = {https://researchr.org/publication/Garcia-GervacioC11},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {27},
number = {6},
pages = {741-752},
}