Reliable design methodology: The combined effect of radiation, variability and temperature - researchr publication authors

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Fernando Garcia-Redondo, Marisa López-Vallejo, Hernan Aparicio, Pablo Ituero. Reliable design methodology: The combined effect of radiation, variability and temperature. In 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2016, Lisbon, Portugal, June 27-30, 2016. pages 1-4, IEEE, 2016. [doi]

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