Fernando Garcia-Redondo, Marisa López-Vallejo, Hernan Aparicio, Pablo Ituero. Reliable design methodology: The combined effect of radiation, variability and temperature. In 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2016, Lisbon, Portugal, June 27-30, 2016. pages 1-4, IEEE, 2016. [doi]
@inproceedings{Garcia-RedondoL16,
title = {Reliable design methodology: The combined effect of radiation, variability and temperature},
author = {Fernando Garcia-Redondo and Marisa López-Vallejo and Hernan Aparicio and Pablo Ituero},
year = {2016},
doi = {10.1109/SMACD.2016.7520646},
url = {https://doi.org/10.1109/SMACD.2016.7520646},
researchr = {https://researchr.org/publication/Garcia-RedondoL16},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2016, Lisbon, Portugal, June 27-30, 2016},
publisher = {IEEE},
isbn = {978-1-5090-0490-4},
}