Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation

Ritesh Garg, Richard Putman, Nur A. Touba. Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 35-42, IEEE Computer Society, 2008. [doi]

Authors

Ritesh Garg

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Richard Putman

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Nur A. Touba

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