Ritesh Garg, Richard Putman, Nur A. Touba. Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 35-42, IEEE Computer Society, 2008. [doi]
Abstract is missing.