Srinivas M. Garimella, Charles E. Stroud. Built-In Self-Test and Diagnosis of Multiple Embedded Cores in SoCs. In Laurence Tianruo Yang, Hamid R. Arabnia, Jürgen Becker, Masaharu Imai, Zoran A. Salcic, editors, Proceedings of The 2005 International Conference on Embedded Systems and Applications, ESA 2005, Las Vegas, Nevada, USA, June 27-30, 2005. pages 130-136, CSREA Press, 2005.
Abstract is missing.