Marie-Claude Gaudel. Test Selection Based on ADT Specifications. In Gregor von Bochmann, Rachida Dssouli, Anindya Das, editors, Protocol Test Systems, V, Proceedings of the IFIP TC6/WG6.1 Fifth International Workshop on Protocol Test Systems, Montreal, Quebec, Canada, 28-30 September, 1992. Volume C-11 of IFIP Transactions, pages 31-40, North-Holland, 1992.
@inproceedings{Gaudel92,
title = {Test Selection Based on ADT Specifications},
author = {Marie-Claude Gaudel},
year = {1992},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/Gaudel92},
cites = {0},
citedby = {0},
pages = {31-40},
booktitle = {Protocol Test Systems, V, Proceedings of the IFIP TC6/WG6.1 Fifth International Workshop on Protocol Test Systems, Montreal, Quebec, Canada, 28-30 September, 1992},
editor = {Gregor von Bochmann and Rachida Dssouli and Anindya Das},
volume = {C-11},
series = {IFIP Transactions},
publisher = {North-Holland},
isbn = {0-444-89980-4},
}