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Test Selection Based on ADT Specifications

Marie-Claude Gaudel. Test Selection Based on ADT Specifications. In Gregor von Bochmann, Rachida Dssouli, Anindya Das, editors, Protocol Test Systems, V, Proceedings of the IFIP TC6/WG6.1 Fifth International Workshop on Protocol Test Systems, Montreal, Quebec, Canada, 28-30 September, 1992. Volume C-11 of IFIP Transactions, pages 31-40, North-Holland, 1992.

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