A Physics based MTJ Compact Model for State-of-the-Art and Emerging STT-MRAM Failure Analysis and Yield Enhancement

Nishtha S. Gaul, Akhilesh Jaiswal 0002, Hongsik Yoon, Taeyoung Lee, Kazutaka Yamane, Joseph Versaggi, Rick Carter, Bipul C. Paul. A Physics based MTJ Compact Model for State-of-the-Art and Emerging STT-MRAM Failure Analysis and Yield Enhancement. In IEEE International Memory Workshop, IMW 2022, Dresden, Germany, May 15-18, 2022. pages 1-4, IEEE, 2022. [doi]

@inproceedings{GaulJYLYVCP22,
  title = {A Physics based MTJ Compact Model for State-of-the-Art and Emerging STT-MRAM Failure Analysis and Yield Enhancement},
  author = {Nishtha S. Gaul and Akhilesh Jaiswal 0002 and Hongsik Yoon and Taeyoung Lee and Kazutaka Yamane and Joseph Versaggi and Rick Carter and Bipul C. Paul},
  year = {2022},
  doi = {10.1109/IMW52921.2022.9779246},
  url = {https://doi.org/10.1109/IMW52921.2022.9779246},
  researchr = {https://researchr.org/publication/GaulJYLYVCP22},
  cites = {0},
  citedby = {0},
  pages = {1-4},
  booktitle = {IEEE International Memory Workshop, IMW 2022, Dresden, Germany, May 15-18, 2022},
  publisher = {IEEE},
  isbn = {978-1-6654-9947-7},
}