Sidharta Gautama, Rik Bellens, Guy De Tré, Johan D Haeyer. Relevance Criteria for Data Mining Using Error-Tolerant Graph Matching. In Ralf Reulke, Ulrich Eckardt, Boris Flach, Uwe Knauer, Konrad Polthier, editors, Combinatorial Image Analysis, 11th International Workshop, IWCIA 2006, Berlin, Germany, June 19-21, 2006, Proceedings. Volume 4040 of Lecture Notes in Computer Science, pages 277-290, Springer, 2006. [doi]
Abstract is missing.