Rahul D. Gavas, Deepan Das, Tanuka Bhattacharjee, Mithun B. Sheshachala, Lalit K. Hissaria, Ramu Reddy Vempada, Venkata Subramanian Viraraghavan, Anirban Dutta Choudhury, Kartik Muralidharan, Ramesh K. Ramakrishnan, P. Balamuralidhar, Arpan Pal. A Sensor-enabled Digital Trier Social Stress Test in an Enterprise Context. In 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2019, Berlin, Germany, July 23-27, 2019. pages 1321-1325, IEEE, 2019. [doi]
@inproceedings{GavasDBSHVVCMRB19,
title = {A Sensor-enabled Digital Trier Social Stress Test in an Enterprise Context},
author = {Rahul D. Gavas and Deepan Das and Tanuka Bhattacharjee and Mithun B. Sheshachala and Lalit K. Hissaria and Ramu Reddy Vempada and Venkata Subramanian Viraraghavan and Anirban Dutta Choudhury and Kartik Muralidharan and Ramesh K. Ramakrishnan and P. Balamuralidhar and Arpan Pal},
year = {2019},
doi = {10.1109/EMBC.2019.8857779},
url = {https://doi.org/10.1109/EMBC.2019.8857779},
researchr = {https://researchr.org/publication/GavasDBSHVVCMRB19},
cites = {0},
citedby = {0},
pages = {1321-1325},
booktitle = {41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2019, Berlin, Germany, July 23-27, 2019},
publisher = {IEEE},
isbn = {978-1-5386-1311-5},
}