Rahul D. Gavas, Deepan Das, Tanuka Bhattacharjee, Mithun B. Sheshachala, Lalit K. Hissaria, Ramu Reddy Vempada, Venkata Subramanian Viraraghavan, Anirban Dutta Choudhury, Kartik Muralidharan, Ramesh K. Ramakrishnan, P. Balamuralidhar, Arpan Pal. A Sensor-enabled Digital Trier Social Stress Test in an Enterprise Context. In 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2019, Berlin, Germany, July 23-27, 2019. pages 1321-1325, IEEE, 2019. [doi]
No references recorded for this publication.
No citations of this publication recorded.