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Model Decay in Long-Term Tracking

Efstratios Gavves, Ran Tao 0004, Deepak K. Gupta, Arnold W. M. Smeulders. Model Decay in Long-Term Tracking. In 25th International Conference on Pattern Recognition, ICPR 2020, Virtual Event / Milan, Italy, January 10-15, 2021. pages 2685-2692, IEEE, 2020. [doi]

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