Xiaoliang Ge, Bastien Mamdy, Albert Theuwissen. A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique. In Arnaud Darmont, Antoine Dupret, Ralf Widenhorn, editors, Image Sensors and Imaging Systems 2016, IMSE 2016, San Francisco, CA, USA, February 14-18, 2016. pages 1-6, Society for Imaging Science and Technology, 2016. [doi]
@inproceedings{GeMT16,
title = {A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique},
author = {Xiaoliang Ge and Bastien Mamdy and Albert Theuwissen},
year = {2016},
doi = {10.2352/ISSN.2470-1173.2016.12.IMSE-282},
url = {https://doi.org/10.2352/ISSN.2470-1173.2016.12.IMSE-282},
researchr = {https://researchr.org/publication/GeMT16},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {Image Sensors and Imaging Systems 2016, IMSE 2016, San Francisco, CA, USA, February 14-18, 2016},
editor = {Arnaud Darmont and Antoine Dupret and Ralf Widenhorn},
publisher = {Society for Imaging Science and Technology},
}