Xiaoliang Ge, Bastien Mamdy, Albert Theuwissen. A comparative noise analysis and measurement for n-type and p-type pixels with CMS technique. In Arnaud Darmont, Antoine Dupret, Ralf Widenhorn, editors, Image Sensors and Imaging Systems 2016, IMSE 2016, San Francisco, CA, USA, February 14-18, 2016. pages 1-6, Society for Imaging Science and Technology, 2016. [doi]
Abstract is missing.