Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique

Jiuhao Ge, Chenkai Yang, Ping Wang, Yongsheng Shi. Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique. Sensors, 20(12):3390, 2020. [doi]

Authors

Jiuhao Ge

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Chenkai Yang

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Ping Wang

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Yongsheng Shi

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