Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique - researchr publication related

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Jiuhao Ge, Chenkai Yang, Ping Wang, Yongsheng Shi. Defect Classification Using Postpeak Value for Pulsed Eddy-Current Technique. Sensors, 20(12):3390, 2020. [doi]

The following publications are possibly variants of this publication:

Frequency Optimization for Enhancement of Surface Defect Classification Using the Eddy Current TechniqueMengbao Fan, Qi Wang, Binghua Cao, Bo Ye, Ali Imam Sunny, Guiyun Tian. sensors, 16(5):649, 2016. [doi]

Surface Defect 3-D Profile Reconstruction Using Eddy Current Pulsed ThermographyXu Zhang, Libing Bai, Yiping Liang, Jinsheng Yang, Jiangshan Ai, Chao Ren. tii, 20(8):10092-10102, August 2024. [doi]

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