Tayasan Milinda H. Gedara, Radwa El Shawi, Vincenzo Loia, Stefania Tomasiello. Automated Machine Learning for Enhanced Digital Image Forgery Detection. In International Joint Conference on Neural Networks, IJCNN 2025, Rome, Italy, June 30 - July 5, 2025. pages 1-7, IEEE, 2025. [doi]
Abstract is missing.