Arda Genc, Ravit Silverstein. Neural Object Detection for 4D-STEM: High-Throughput Sub-Pixel Electron Diffraction Pattern Recognition. In IEEE/CVF International Conference on Computer Vision, ICCV 2025 - Workshops, Honolulu, HI, USA, October 19-20, 2025. pages 3624-3634, IEEE, 2025. [doi]
Abstract is missing.