Frank Gennari, Andrew R. Neureuther. A Pattern Matching System for Linking TCAD and EDA. In 5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA. pages 165-170, IEEE Computer Society, 2004. [doi]
@inproceedings{GennariN04,
title = {A Pattern Matching System for Linking TCAD and EDA},
author = {Frank Gennari and Andrew R. Neureuther},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/isqed/2004/2093/00/20930165abs.htm},
tags = {pattern matching},
researchr = {https://researchr.org/publication/GennariN04},
cites = {0},
citedby = {0},
pages = {165-170},
booktitle = {5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2093-6},
}