Paul R. Genssler, Hussam Amrouch. Brain-Inspired Computing for Wafer Map Defect Pattern Classification. In IEEE International Test Conference, ITC 2021, Anaheim, CA, USA, October 10-15, 2021. pages 123-132, IEEE, 2021. [doi]
@inproceedings{GensslerA21,
title = {Brain-Inspired Computing for Wafer Map Defect Pattern Classification},
author = {Paul R. Genssler and Hussam Amrouch},
year = {2021},
doi = {10.1109/ITC50571.2021.00020},
url = {https://doi.org/10.1109/ITC50571.2021.00020},
researchr = {https://researchr.org/publication/GensslerA21},
cites = {0},
citedby = {0},
pages = {123-132},
booktitle = {IEEE International Test Conference, ITC 2021, Anaheim, CA, USA, October 10-15, 2021},
publisher = {IEEE},
isbn = {978-1-6654-1695-5},
}