Fast Multi-level Test Generation at the RTL

Kelson Gent, Michael S. Hsiao. Fast Multi-level Test Generation at the RTL. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2016, Pittsburgh, PA, USA, July 11-13, 2016. pages 553-558, IEEE, 2016. [doi]

Authors

Kelson Gent

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Michael S. Hsiao

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