Kelson Gent, Michael S. Hsiao. Fast Multi-level Test Generation at the RTL. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2016, Pittsburgh, PA, USA, July 11-13, 2016. pages 553-558, IEEE, 2016. [doi]
@inproceedings{GentH16-0,
title = {Fast Multi-level Test Generation at the RTL},
author = {Kelson Gent and Michael S. Hsiao},
year = {2016},
doi = {10.1109/ISVLSI.2016.95},
url = {http://doi.ieeecomputersociety.org/10.1109/ISVLSI.2016.95},
researchr = {https://researchr.org/publication/GentH16-0},
cites = {0},
citedby = {0},
pages = {553-558},
booktitle = {IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2016, Pittsburgh, PA, USA, July 11-13, 2016},
publisher = {IEEE},
isbn = {978-1-4673-9039-2},
}