M.-H. Gentil, Didier Crestani, Abdennour El Rhalibi, C. Durante. A new high level testability measure: description and evaluation. In 12th IEEE VLSI Test Symposium (VTS'94), April 25-28, 1994, Cherry Hill, New Jersey, USA. pages 421-426, IEEE Computer Society, 1994. [doi]
Abstract is missing.