Characterization of logical masking and error propagation in combinational circuits and effects on system vulnerability - researchr publication authors

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Nishant J. George, John Lach. Characterization of logical masking and error propagation in combinational circuits and effects on system vulnerability. In Proceedings of the 2011 IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2011, Hong Kong, China, June 27-30 2011. pages 323-334, IEEE, 2011. [doi]

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