Nishant J. George, John Lach. Characterization of logical masking and error propagation in combinational circuits and effects on system vulnerability. In Proceedings of the 2011 IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2011, Hong Kong, China, June 27-30 2011. pages 323-334, IEEE, 2011. [doi]
@inproceedings{GeorgeL11-0, title = {Characterization of logical masking and error propagation in combinational circuits and effects on system vulnerability}, author = {Nishant J. George and John Lach}, year = {2011}, doi = {10.1109/DSN.2011.5958246}, url = {http://doi.ieeecomputersociety.org/10.1109/DSN.2011.5958246}, researchr = {https://researchr.org/publication/GeorgeL11-0}, cites = {0}, citedby = {0}, pages = {323-334}, booktitle = {Proceedings of the 2011 IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2011, Hong Kong, China, June 27-30 2011}, publisher = {IEEE}, isbn = {978-1-4244-9233-6}, }