Impact of total dose on heavy-ion upsets in floating gate arrays

Simone Gerardin, M. Bagatin, Alessandro Paccagnella, G. Cellere, A. Visconti, M. Bonanomi. Impact of total dose on heavy-ion upsets in floating gate arrays. Microelectronics Reliability, 50(9-11):1837-1841, 2010. [doi]

Abstract

Abstract is missing.