Patrick Gering, Thomas Knothe, Huy Viet Schulz. Towards a Modular Testing Environment for Digital Battery Passports. In Francesco Longo 0002, Vittorio Solina, Emmanuel Francalanza, editors, Proceedings of the 7th International Conference on Industry of the Future and Smart Manufacturing (ISM 2025), La Valletta, Malta, 12-14 November 2025. Volume 277 of Procedia Computer Science, pages 1828-1837, Elsevier, 2025. [doi]
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